Research of relationship between light reflectance and surface moisture content in tailings samples using hyperspectral images

Authors

  • Monserrat Sánchez Universidad Técnica Federico Santa María, Departamento de Ingeniería Civil, Valparaíso, Chile
  • Gonzalo Suazo Universidad Técnica Federico Santa María, Departamento de Ingeniería Civil, Valparaíso, Chile
  • Víctor Araya Universidad Técnica Federico Santa María, Departamento de Ingeniería Civil, Valparaíso, Chile
  • Gabriel Villavicencio Pontificia Universidad Católica de Valparaíso, Valparaíso, Chile. https://orcid.org/0000-0002-5342-0063

DOI:

https://doi.org/10.4067/S0718-28132022000100077

Keywords:

hypespectral imaging, moisture content, tailings storage facilities, NDVI

Abstract

Proper tailings storage facilities (TSF) management can be done by monitoring various variables, such as moisture, which influences at physical and chemical stability phenomena. Nowadays, there are no continuous moisture controls due to the dangers associated with taking samples in tailings, generally in low-density states, making access difficult. Due to the recent hyperspectral imaging technologies and the successful use in monitoring interest variables (moisture, fines content, mineralogy) in areas such as hydrology and agriculture, therefore, this research uses hyperspectral images to estimate surface moisture in TSF using copper and iron tailings samples, which are subjected to active illumination from a 980 nm laser and monitored in a desiccation process in the moisture range from saturation to dry state, including density and fine content effects. Results show a parabolic relationship between moisture and light reflection, which, added to the use of the normalized difference vegetation index (NDVI), allow estimating the surface samples moisture content, generating an auspicious method for the continuous monitoring of humidity in TSF.

Author Biographies

Monserrat Sánchez, Universidad Técnica Federico Santa María, Departamento de Ingeniería Civil, Valparaíso, Chile

Ingeniera del Departamento de Ingeniería Civil, Universidad Técnica Federico Santa María, Avenida España 1680, Valparaíso, Chile. Correo electrónico: mo.sanchez.oyarzun@gmail.com.

Gonzalo Suazo, Universidad Técnica Federico Santa María, Departamento de Ingeniería Civil, Valparaíso, Chile

Ingeniero del Departamento de Ingeniería Civil, Universidad Técnica Federico Santa María, Avenida España 1680, Valparaíso, Chile. Correo electrónico : gonzalo.suazo@usm.cl.

Víctor Araya, Universidad Técnica Federico Santa María, Departamento de Ingeniería Civil, Valparaíso, Chile

Ingeniero del Departamento de Ingeniería Civil, Universidad Técnica Federico Santa María, Avenida España 1680, Valparaíso, Chile. Correl elctrónico: gonzalo.suazo@usm.cl.

Gabriel Villavicencio, Pontificia Universidad Católica de Valparaíso, Valparaíso, Chile.

Ingeniero Constructor; Pontificia Universidad Católica de Valparaíso, Chile.Doctor Ingeniero. Especialidad Mecánica de Suelos; Universidad Blaise Pascal. Francia. Post doctorado Departamento de Ingeniería Civil Universidad Blaise Pascal. Francia, participa en Grupo de Geotecnia, y es académico de la Escuela de Ingeniería de Construcción y Transporte, Pontificia Universidad Católica de Valparaíso, Avenida Brasil #2147, Valparaíso, Chile. Correo elctrónico : gabriel.villavicencio@pucv.cl.

Published

2022-06-29

How to Cite

Sánchez, M., Suazo, G. ., Araya, V., & Villavicencio, G. (2022). Research of relationship between light reflectance and surface moisture content in tailings samples using hyperspectral images. Obras Y Proyectos, (31), 77–84. https://doi.org/10.4067/S0718-28132022000100077

Issue

Section

Articles